发明名称 |
SEMICONDUCTOR DEVICE AND ALIGNMENT METHOD |
摘要 |
PURPOSE:To provide a semiconductor device which easily prevents dust from being generated due to release of an etching residue which remains on a side wall of a positioning mark without any reduction in detection sensitivity for the semiconductor device which is provided with the alignment mark for alignment at the time of patterning. CONSTITUTION:An alignment mark consisting of opposing region layers 17a and 17b which oppose each other and a band-shaped region layer 16a which is sandwiched by the opposing region layers 17a and 17b and generates a reflection light with a light intensity which is larger than that from the above opposing regions 17a and 17b for irradiation of a position detection light is provided on a surface layer of a semiconductor substrate 16. |
申请公布号 |
JPH04332113(A) |
申请公布日期 |
1992.11.19 |
申请号 |
JP19910101036 |
申请日期 |
1991.05.02 |
申请人 |
FUJITSU LTD |
发明人 |
MUTO HIDEJI;OIKAWA NOBUHIRO |
分类号 |
G03F9/00;H01L21/027;H01L21/30 |
主分类号 |
G03F9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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