发明名称 SEMICONDUCTOR DEVICE AND ALIGNMENT METHOD
摘要 PURPOSE:To provide a semiconductor device which easily prevents dust from being generated due to release of an etching residue which remains on a side wall of a positioning mark without any reduction in detection sensitivity for the semiconductor device which is provided with the alignment mark for alignment at the time of patterning. CONSTITUTION:An alignment mark consisting of opposing region layers 17a and 17b which oppose each other and a band-shaped region layer 16a which is sandwiched by the opposing region layers 17a and 17b and generates a reflection light with a light intensity which is larger than that from the above opposing regions 17a and 17b for irradiation of a position detection light is provided on a surface layer of a semiconductor substrate 16.
申请公布号 JPH04332113(A) 申请公布日期 1992.11.19
申请号 JP19910101036 申请日期 1991.05.02
申请人 FUJITSU LTD 发明人 MUTO HIDEJI;OIKAWA NOBUHIRO
分类号 G03F9/00;H01L21/027;H01L21/30 主分类号 G03F9/00
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