DEVICE FOR INSPECTING LOGIC CIRCUIT AND AUTOMATIC GENERATING DEVICE FOR TEST PATTERN

摘要

PURPOSE:To provide a test pattern automatic generating device and a logic circuit inspecting device which can reduce the burden of a designer. CONSTITUTION:A system is characterized by providing logic circuit chart generating parts 1 and 4 generating a logic circuit chart based on logic circuit chart information, a change information storing part 3 storing change information for changing logic circuit constitution transmitted from the logic circuit chart generating parts 1 and 4 and a test pattern generating part 2 which automatically generates the test pattern detecting fault inside a circuit generated based on logic circuit information supplied from the logic circuit chart generating part 1 and 4 or change logic circuit information which logic circuit information supplied from the logic circuit chart generating parts 1 and 4 is changed in accordance with change information supplied from the change information storing part 3.