发明名称 Tester interconnect system.
摘要 <p>An automatic circuit tester (10) includes a scanner bus (50) that comprises series of signal-path links (70A-H, 72A-H) and connectors (51) into which scanner boards (46, 47) are plugged. Each scanner board includes switches (74A-H, 76A-H, and 78A-H) that in different states can (i) connect together the links on opposite sides of the scanner board so as to forward signals along the link sequence and (ii) connect the link on one side to an instrument (18) or system pin (24) while isolating the link on the other side from the first link and the instrument or system pin. The arrangement makes it possible to retain the advantages of a bus-type organization without suffering the stub-length problems normally associated with conventional buses. &lt;IMAGE&gt;</p>
申请公布号 EP0502624(A1) 申请公布日期 1992.09.09
申请号 EP19920301302 申请日期 1992.02.18
申请人 GENRAD, INC. 发明人 PINCUS, ROBERT H.;WINROTH, CALVIN S.
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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