首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
BETA ZEOLITES HAVING LOW ALUMINIUM CONTENT
摘要
A crystalline low-aluminum boron beta zeolite is prepared using a diquaternary ion as a template.
申请公布号
NZ234405(A)
申请公布日期
1992.05.26
申请号
NZ19900234405
申请日期
1990.07.06
申请人
CHEVRON RESEARCH & TECHNOLOGY CO
发明人
ZONES, STACEY I;HOLTERMANN, DENNIS L;JOSSENS, LAWRENCE W;SANTILLI, DONALD S;RAINIS, ANDREW;ZIEMER, JAMES N
分类号
C01B33/40;B01J29/04;B01J29/70;B01J29/86;B01J29/87;B01J29/88;C01B33/42;C01B35/12;C01B39/00;C01B39/04;C01B39/12;C01B39/48;C07C2/12;C07C2/66;C07C4/06;C07C5/27;C07C6/12;C07C9/10;C07C9/14;C07C15/00;C07C15/02;C10G11/02;C10G11/05;C10G35/06;C10G35/095;C10G45/64;C10G47/16
主分类号
C01B33/40
代理机构
代理人
主权项
地址
您可能感兴趣的专利
SOLID-STATE IMAGE PICK-UP APPARATUS, IMAGE PICK-UP SYSTEM, AND METHOD OF DRIVING SOLID-STATE IMAGE PICK-UP APPARATUS
MANUFACTURING METHOD OF SENSING INTEGRATED CIRCUIT
THIN-FILM AMBIPOLAR LOGIC
Field-Effect Transistor, and Memory and Semiconductor Circuit Including the Same
Semiconductor Device with Thermally Grown Oxide Layer Between Field and Gate Electrode and Method of Manufacturing
Capacitor in Post-Passivation Structures and Methods of Forming the Same
Glass/Ceramic Replacement of Epoxy for High Temperature Hermetically Sealed Non-Axial Electronic Packages
WAFER BONDING STRUCTURES AND WAFER PROCESSING METHODS
WAFER ETCHING APPARATUS AND METHOD FOR CONTROLLING ETCH BATH OF WAFER
METHOD FOR MANUFACTURING LIGHT EMITTING DEVICE
Metal-insulator-semiconductor (MIS) contact with controlled defect density
Method for Forming a Vertical Electrical Conductive Connection
CONDUCTIVE ELEMENT STRUCTURE AND METHOD
Self-Aligned Double Spacer Patterning Process
POST TREATMENT FOR DIELECTRIC CONSTANT REDUCTION WITH PORE GENERATION ON LOW K DIELECTRIC FILMS
WAFER POLISHING APPARATUS AND METHOD
METHOD FOR FORMING A METAL SILICIDE USING A SOLUTION CONTAINING GOLD IONS AND FLUORINE IONS
SIDEWALL IMAGE TEMPLATES FOR DIRECTED SELF-ASSEMBLY MATERIALS
BLOCK MASK LITHO ON HIGH ASPECT RATIO TOPOGRAPHY WITH MINIMAL SEMICONDUCTOR MATERIAL DAMAGE
DATA PROCESSING DEVICE AND DATA PROCESSING METHOD