发明名称 Semiconductor dynamic memory device.
摘要 <p>The film thickness is increased of at least a portion of word lines over which a storage node electrode of the capacitor for storing charges extends in a DRAM having word lines, bit lines and memory cells comprising one transistor and one stacked capacitor for charge storage. This increases the surface area of the storage node electrode, therefore, the opposing areas of the storage node electrode and the cell plate electrode of the capacitor for storing charges. The storage capacity is increased without imposing additional burden on processibility. &lt;IMAGE&gt;</p>
申请公布号 EP0464747(A1) 申请公布日期 1992.01.08
申请号 EP19910110877 申请日期 1991.07.01
申请人 NEC CORPORATION 发明人 YOSHIDA, NAOYUKI
分类号 H01L27/105;H01L27/108 主分类号 H01L27/105
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