| 摘要 |
<p>The invention is a pattern matcher which (i) compares two or more multi-symbol data patterns, symbol-by-symbol, and detects any mis-matches, or errors, (ii) combines into a relatively small number of encoded bits information relating to the number of errors, and (iii) examines a single encoded bit to determine if the two patterns "match", i.e., if they differ by less than a predetermined number of symbols, or error threshold. The invention further includes a multi-bit output signal which may be used to determine, for patterns which match, the actual number of errors. <IMAGE></p> |
