发明名称 Low resistance contacts to semiconductor materials
摘要 An ohmic contact to a III-V semiconductor material comprises substantially eighty to ninety-five percent by weight of tungsten, five to ten percent by weight of antimony, and zero to fifteen percent by weight of indium. The materials are simultaneously sputtered from separate targets in a sputtering reactor.
申请公布号 US5075756(A) 申请公布日期 1991.12.24
申请号 US19900576551 申请日期 1990.08.31
申请人 AT&T BELL LABORATORIES 发明人 DUTTA, RANJAN
分类号 H01L21/285;H01L29/45 主分类号 H01L21/285
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