发明名称 SYSTEM FOR GENERATING TEST DATA FROM HARDWARE DESIGN LANGUAGE
摘要 PURPOSE:To automatically generate test data from hardware operation description of low level by providing a hardware description model with an internal resource description part and providing a transmission means which transfers data between an interface resource and an internal resource. CONSTITUTION:Transmission means 2-1 and 2-2 are provided which transfer data to an internal resource 3 in the case of the internal resource 3 included in the applied test input and which transfer data to an interface resource 1 in the case of the occurrence of output for the applied test input to the internal resource 3. Thus, the hardware description model is provided with the internal resource description part like a register or a flip flop which cannot be observed from the external and test data is automatically generated from the description language based on this hardware description model, and test data is generated even if there is the internal resource 3 like a register or a flip flop which cannot be directly observed from the external.
申请公布号 JPH03262045(A) 申请公布日期 1991.11.21
申请号 JP19900062389 申请日期 1990.03.12
申请人 OKI ELECTRIC IND CO LTD 发明人 HIRUTA NORIYUKI;YAMASHITA TAKAO;KIYAMA KOJI
分类号 G06F11/22;G06F17/50 主分类号 G06F11/22
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