首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
INTER-ATOMIC FORCE MEASURING MICROSCOPE
摘要
申请公布号
JPH03259709(A)
申请公布日期
1991.11.19
申请号
JP19900059631
申请日期
1990.03.09
申请人
NIKON CORP
发明人
FUJII TORU
分类号
G01B21/20;G01Q20/02;G01Q60/24;G01Q60/26;H01J37/28
主分类号
G01B21/20
代理机构
代理人
主权项
地址
您可能感兴趣的专利
PREPARATION OF LIQUID ABSORBENT FOR CARBON MONOXIDE
COPYING MACHINE
PHOTOMASK
PACKAGING METHOD OF LIGHT EMITTING AND PHOTODETECTING DEVICE
OSCILLATING DEVICE
DRIVING CIRCUIT
DEVICE FOR DETECTING CASSETTE IN CASSETTE TAPE RECORDER OR THE LIKE
ELECTRONIC FLASH DEVICE
TIMING SYNCHRONIZATION CIRCUIT
DEVICE OF HEAT EXCHANGE TYPE WITH FLUDIZED BED FOR PRODUCING SLAG PARTICLE
CONVERTER OF JAPANESE SYLLABARY TO CHINESE CHARACTER
MAGNETIC RECORDING MEDIUM
MAGNETIC RECORDING MEDIUM
OPTICAL SWITCH
ABSOLUTE VALUE CIRCUIT
INFORMATION RETRIEVING DEVICE
POLYCRYSTALLINE THIN-FILM TRANSISTOR
INTEGRATED SEMICONDUCTOR STORAGE DEVICE
LAMINATED TRANSFORMER
INTERMITTENT SLOW REPRODUCER