发明名称 PLASMA REACTION CHAMBER HAVING CONDUCTIVE DIAMOND-COATED SURFACES
摘要 <p>A reactive ion etching chamber is disclosed having conductive diamond-coated wall surfaces (1, 2) to prevent the undesired sputtering of wall particles which can contaminate semiconductor device workpieces undergoing etching within the chamber. The diamond layer is conductive to enable the coated chamber walls to be used as an electrical ground in the reactive ion etching process.</p>
申请公布号 WO1991017562(A1) 申请公布日期 1991.11.14
申请号 US1990005767 申请日期 1990.10.09
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