发明名称 X-ray optical system formed by multilayer reflecting mirrors for reflecting X-rays of different wavelengths
摘要 An optical system for X rays having a multilayer reflecting mirror which has high reflectances for X rays of different wavelengths. One type of multilayer reflecting mirror is such that the mirror surface of the multilayer reflecting mirror is divided into a plurality of regions, and the regions are provided with multilayers which are such that the reflectance of each multilayer is maximum for X rays of a corresponding wavelength. Another type of multilayer reflecting mirror has a substrate and a plurality of multilayer laid on the substrate, wherein the wavelength of X rays to be reflected with a maximum reflectance varies from multilayer to multilayer. The optical system for X rays according to the present invention is a focusing optical system having a plurality of such multilayer reflecting mirrors and can obtain object images by using X rays of a plurality of wavelengths.
申请公布号 US5022064(A) 申请公布日期 1991.06.04
申请号 US19900474152 申请日期 1990.02.02
申请人 OLYMPUS OPTICAL CO., LTD. 发明人 IKETAKI, YOSHINORI
分类号 G02B5/08;G21K1/06 主分类号 G02B5/08
代理机构 代理人
主权项
地址
您可能感兴趣的专利