SELECTIVE ION DETECTION USING MASS SPECTROMETER,申请号JP19890218385-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	SELECTIVE ION DETECTION USING MASS SPECTROMETER
摘要
申请公布号	JPH0381660(A)	申请公布日期	1991.04.08
申请号	JP19890218385	申请日期	1989.08.24
申请人	SHIMADZU CORP	发明人	SHIRATO KATSUAKI;WAKE HIROAKI
分类号	G01N27/62;H01J37/05	主分类号	G01N27/62
代理机构		代理人
主权项
地址

您可能感兴趣的专利

JUICE OF FAGOPYRUM TATARICUM GARETN AND PREPARATION METHOD THEREOF

CARBAZOLE DERIVATIVES AND ORGANIC LIGHT EMITTING DEVICE USING THE SAME

WAFER DEPOSITION APPARATUS AND METHOD HAVING SAME

BEAD SETTER FOR BEAD TRANSPORT

VIEWING TOOL FOR MONITORING GROWTH OF SINGLE CRYSTAL AND APPARATUS FOR GROWING SINGLE CRYSTAL INCLUDING THE SAME

EVALUATION METHOD OF THERMAL OXIDE LAYER THICKNESS BY MEANS OF BREAKDOWN VOLTAGE

FISH LURING LAMP FOR UNDERWATER

SAFETY APPARATUS OF INDUSTRIAL VEHICLE AND SAFETY FUNCTION CONTROLLING METHOD THEREOF

FIXING STRUCTURE OF A TENT

WHEELCHAIR WHEEL

METHOD OF MANUFACTURING NANOPARTICLES OF POLY(3,4-ETHYLENEDIOXYTHIOPHENE)

TOOTHBRUSH HANDLE

MATRIX TABLET FOR SUSTAINED RELEASE OF TRIMETAZIDINE AFTER ORAL ADMINISTRATION

HDT ADJUVANT FOR CONCRETE AND CEMENT WITH MULTIPLE ACTION (ACCELERATION OF HARDENING, COMPRESSING)

DRIVING MIRROR SEEING AHEAD

DOMESTIC THERMAL STATION

PROCESS FOR EXEMPTION OF FE OF SOLDERING FLUX APPLIED IN HOT-DIP GALVANIZING

METHOD OF MANUFACTURING EXTRACELLULAR ELECTRODES FROM SINGLE CRYSTAL SILICON SUBSTRATE HAVING PARALLEL SIDE WALLS AND ROUNDED EDGES, FORMED BY WET ETCH WHICH METHOD MAY BE INTEGRATED TO CMOS TECHNOLOGY