发明名称 Thin film transistor
摘要 Thin film field effect transistors are disclosed having direct or near direct contact of the source and drain electrodes to the channel region. Inverted gate and non-inverted gate types are fabricated by forming metallic source and drain electrodes within a layer of semiconductor material in contact with the channel region. The electrodes are formed by converting monocrystalline, polycrystalline or amorphous silicon regions to a refractory metal such as tungsten by using a non-self-limiting metal hexafluoride reduction process. The tungsten conversion process is isotropic and provides self-alignment of the source and drain electrodes with the gate in the non-inverted gate TFT. The process is low temperature, allowing the use of amorphous silicon as the semiconductor material. The transistors are especially useful for formation on large glass substrates for fabricating large flat panel displays.
申请公布号 US4998152(A) 申请公布日期 1991.03.05
申请号 US19900474203 申请日期 1990.01.24
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BATEY, JOHN;JOSHI, RAJIV V.
分类号 H01L21/336;H01L29/45;H01L29/786 主分类号 H01L21/336
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