发明名称 Manufacturing process for an integrated circuit comprising double gate components
摘要 A process for manufacturing integrated circuits comprising insulated gate MOS transistors and double gate memory components, comprises the following steps: forming on the areas where the memory components will be formed a first insulating layer (2) and a first gate level (4); forming on the transistor areas and the memory areas a second insulating layer (5), a second gate level (6) and a first photoresist layer (7); etching the first photoresist layer and the second gate level according to chosen configurations; coating the transistor areas with a second photoresist layer (20). This process further comprises the following steps: selectively etching the second photoresist layer at the center of the places where the transistor drains and sources are to be formed; etching the apparent oxide areas and then the apparent gate and substrate areas; removing the second photoresist layer; and carrying out an ionic implantation of the drains and sources.
申请公布号 US4997777(A) 申请公布日期 1991.03.05
申请号 US19880284425 申请日期 1988.12.14
申请人 BOIVIN, PHILIPPE 发明人 BOIVIN, PHILIPPE
分类号 H01L21/28;H01L21/336;H01L21/8234;H01L27/088;H01L29/08;H01L29/78 主分类号 H01L21/28
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