发明名称 Drive device for an apparatus for electrical function testing of wiring matrices
摘要 A drive device for an apparatus for electrical function testing of wiring matrices, which has optimally simple electrode shapes for the purpose of a further miniaturization with a two-electrode arrangement. For testing printed circuit boards a non-touching plasma contacting is used whereby two respectively selected measuring locations of a wiring matrix can be contacted via allocated discharge channels and their electrodes. The drive of the measuring locations (test points) occurs via control gas discharges that are generated by applying an adequately high voltage between the electrodes. By applying a voltage between the gas discharges, a current conduction that can be evaluated for test purposes is generated for a conductive connection between the test points.
申请公布号 US4967149(A) 申请公布日期 1990.10.30
申请号 US19880286347 申请日期 1988.12.19
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 DOEMENS, GUENTER;ROSE, THOMAS;HOFFMANN, DETLEF;HEISEN, ARNOLD
分类号 G01R1/073;G01R1/07;G01R31/302;G01R31/304 主分类号 G01R1/073
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