Digitally scanned extended electron source in vacuum

摘要

A device is provided for detecting defects in wire or cable insulation which is located in a vacuum without disconnecting the cable by synchronously detecting the current in a sense conductor with respect to the potential waveform existing or imposed on the cable under test. A sense conductor and a scanned extended electron source having a linear cathode array are both placed in close proximity to and along the cable under test. Only a small portion of the cathodes in the linear array are excited at any one time and by placing the proper signals on the excitation conductors of the electron source, the electron generation scans or propagates along the entire length of the extended electron source. The current flowing in the sense conductor due to the electrons from the electron source varies depending upon the presence of defects in the cable insulation.