METHOD AND APPARATUS FOR MEASURING THICKNESS OF THIN INSULATING FILM,申请号JP19890058043-传众专利搜索

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发明名称	METHOD AND APPARATUS FOR MEASURING THICKNESS OF THIN INSULATING FILM
摘要
申请公布号	JPH02140604(A)	申请公布日期	1990.05.30
申请号	JP19890058043	申请日期	1989.03.13
申请人	NANOMETORITSUKUSU INC	发明人	BINSENTO JIEE KOOTSU;WAAREN DABURIYUU RIN
分类号	G01B11/06	主分类号	G01B11/06
代理机构		代理人
主权项
地址

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