发明名称 Flaw detector for magnetographic quality inspection
摘要 A flaw detector includes a readout unit; a sensor of cycles or lines, and a mechanism for driving the magnitogram and a magnetosensitive transducer. A permanent memory is made as a magnetic medium and a recording magnetic head, a test data processing unit, an interface, and a computing device are provided.
申请公布号 US4930026(A) 申请公布日期 1990.05.29
申请号 US19880170851 申请日期 1988.03.21
申请人 KLJUEV, VLADIMIR V.;KOZLOV, VALERY S.;VOLODCHENKO, DMITRY B.;STEPANENKO, ALEXANDR V.;BARANOVSKY, VLADIMIR I.;KOROLKOV, MIKHAIL I.;SEMENOV, OREST S. 发明人 KLJUEV, VLADIMIR V.;KOZLOV, VALERY S.;VOLODCHENKO, DMITRY B.;STEPANENKO, ALEXANDR V.;BARANOVSKY, VLADIMIR I.;KOROLKOV, MIKHAIL I.;SEMENOV, OREST S.
分类号 B23K31/12;G01N27/82;G01N27/85 主分类号 B23K31/12
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