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发明名称
SYSTEM FOR TESTING SIGNAL
摘要
申请公布号
JPH01255355(A)
申请公布日期
1989.10.12
申请号
JP19880083390
申请日期
1988.04.05
申请人
NEC CORP
发明人
MURAYAMA EIICHI
分类号
H04M3/26;H04Q1/22
主分类号
H04M3/26
代理机构
代理人
主权项
地址
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