| 摘要 |
The invention relates to a device for ascertaining failure data from ruptures of electrically conducting test pieces exposed to continuous loading, preferably leaf springs. The test pieces are here connected in parallel with components causing a voltage drop, e.g. diodes, and the individual test pieces with the diodes are connected in series. This series circuit is connected to a voltage source. Furthermore, means are provided which determine the voltage drops occurring at the diodes in the case of rupture of the test pieces. At each rupture, the voltage drop is increased by the threshold value of a diode.
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