| 摘要 |
PURPOSE:To correctly inspect and measure a high-frequency IC by using an IC socket with a specific contact pin requiring a small pressing force. CONSTITUTION:A contact pin 3 has a connecting terminal 3a on one side of a base section 3b and also has the first contact piece 3c with a contact face 3e which is nearly rectangular to the base section 3b at nearly the corresponding position on the other side. The second contact piece 3g having the contact end section provided with a contact face 3f capable of contacting with the contact face 3e of the first contact piece 3c via a spring action section 3d from the base section 3b is formed, and when the contact end section of the second contact piece 3g is pressed, both contact faces 3e, 3f are brought into contact by pressure. The distance between an IC package 1 and a printed circuit board is thereby shortened, the flow path of the current is made linear, thus the self- inductance is decreased, and the high-frequency characteristic of the IC package 1 can be correctly measured.
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