THE METHOD AND SYSTEM OF THICKNESS MEASURING,ESPECIALLY OF THIN ELEMENTS,申请号PL19860262728-传众专利搜索

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发明名称	THE METHOD AND SYSTEM OF THICKNESS MEASURING,ESPECIALLY OF THIN ELEMENTS
摘要
申请公布号	PL262728(A1)	申请公布日期	1988.08.18
申请号	PL19860262728	申请日期	1986.12.01
申请人		发明人
分类号	G01B;G01B11/02;(IPC1-7):G01B/	主分类号	G01B
代理机构		代理人
主权项
地址

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