| 摘要 |
A contactor assembly for rapidly and repeatedly electronically testing surface-mounted integrated circuits (IC's), in conjunction with a test handler. The contactor assembly has rows of flexible, slightly bent, cantilevered contacts which are deformed into a plane parallel to the device when undergoing the electronic test. A conductive plate or plates including a capacitor or capacitors is positioned parallel to and closely spaced from the device under test ("DUT"). The capacitor is a decoupler and acts to minimize ground noise during current surges. Ground cables interleaved with signal cables, and in some embodiments the signal lines interacting with other elements of the assembly, cooperate to produce generally "characteristic" (purely resistive) impedance to a fast rising test signal. The assembly may include a plug which fits into a socket designed for the DUT.
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