发明名称 Semiconductor memory device with high voltage switch
摘要 A semiconductor memory device according to the present invention includes a first high-voltage switch (20) formed by a first transistor (21), a second transistor (22), a first capacitor (23) and a third transistor (24) and a second high-voltage switch (30) formed by a fourth transistor (31), a fifth transistor (32), a second capacitor (33) and a sixth transistor (34). In a write cycle, input data are stored in capacitors (25, 35). In an erase cycle, the second high-voltage switch (30) is driven by a clock signal ( phi 2) to make the control gate line (4) rise at a high voltage. In a program cycle, the first high-voltage switch (20) is driven by a clock signal ( phi 1) to make the bit line of the bit to be written with data "0" rise at a high voltge, and upon completion of the program cycle, charges stored in the capacitor (25) are discharged to reset a column latch. Thus, the device requires no inverter and may be provided with only one high voltage source.
申请公布号 US4733371(A) 申请公布日期 1988.03.22
申请号 US19860900440 申请日期 1986.08.26
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TERADA, YASUSHI;NAKAYAMA, TAKESHI;KOBAYASHI, KAZUO
分类号 G11C17/00;G11C16/04;G11C16/06;G11C16/12;(IPC1-7):G11C11/40;H03K17/10 主分类号 G11C17/00
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