发明名称 Contacting device in the form of a so-called needle card for microelectronic components to be tested and having a large number of pins
摘要 The contacting needles (2) are of U-shape design and arranged in such a manner that in each case one of the two legs (3) of the needles (2) protrudes vertically downwards through a guide hole (4) of narrow tolerances in the needle card (1) and its point presses elastically onto the contact pad (5) of the component (6) to be tested, that the in each case other leg (7) of the needles (2) is connected to the feed lines (8) to the test device and that the part (9) of the needles (2) connecting the two legs is designed to be straight and is arranged at a close distance from the needle card (1). <IMAGE>
申请公布号 DE3629407(A1) 申请公布日期 1988.03.03
申请号 DE19863629407 申请日期 1986.08.29
申请人 SIEMENS AG 发明人 SEINECKE,SIEGFRIED,DR.
分类号 G01R1/067;G01R1/073;H01L21/66;(IPC1-7):G01R31/28 主分类号 G01R1/067
代理机构 代理人
主权项
地址