Semiconductor device testing device

摘要

A semiconductor device testing device for testing a semiconductor device having input/output terminals includes a dynamic load circuit provided for each of the input/output terminals of the semiconductor device and a comparator provided for each of the input/output terminals of the semiconductor device which compares the voltage value obtained at the input/output terminal with a predetermined value to detect whether the internal state of the semiconductor device is a high impedance state or not. The confirmation of the electrical connection between the semiconductor device and the testing device is thereby conducted by the dynamic load circuit and the comparator.