发明名称 METHOD AND DEVICE FOR INSPECTION
摘要 PURPOSE:To improve the sensitivity of inspection by comparing the difference between reflected or scattered light beams generated at a 1st time and a 2nd time with a specific threshold value. CONSTITUTION:A specific area on a body 2 to be inspected is irradiated with inspection light 3 from a light source 4 and then the surface of the body 3 to be inspected is scanned continuously by the inspection light 3. At this time, scattered or reflected light 7 generated in the specific area of the surface of the objective body 2 irradiated with the inspection light 3 is made incident on an photoelectric transducing means 6 through an objective 5. Here, the signal S1 of the quantity of light 7 detected by the means 6 at the 1st time is transmitted to a comparison part 10 through a 1st signal line 8 where a delay part D is interposed. Further, the signal S2 of the quantity of light 7 detected by the means 6 at the 2nd time which is a specific time after the 1st time is transmitted directly to a comparison part 10 through a 2nd signal line 9 and the comparison part 10 inputs the signals S1 and S2 of the quantities of light 7 at the same time and the difference in the quantity of light is compared with the specific threshold value. Thus, the sensitivity of the inspection can be improved.
申请公布号 JPS62297747(A) 申请公布日期 1987.12.24
申请号 JP19860140053 申请日期 1986.06.18
申请人 HITACHI LTD 发明人 TANABE YOSHIKAZU;ISHIKAWA KATSUHIKO
分类号 H01L21/66;G01N21/88;G01N21/94;G01N21/956 主分类号 H01L21/66
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