| 摘要 |
PURPOSE:To perform a test of a memory element by supplying data information to a pattern memory as address information for access and then driving the data pin of the memory element based on the output information on the pattern memory. CONSTITUTION:When a multiplexer 12 is controlled at the side of an address information signal 18, the memory information on the address of a pattern memory 16 designated by the signal 18 is read out as an output information signal 22. Thus the data pin of a memory element 30 is driven. In this case, the test of the element 30 is possible by driving the data pin in a pattern of considerably complicated data information. However, it is impossible to change optionally the data information regardless of an address. Thus the test of the memory 30 is possible by driving the data pin according to the data information having complicated changes and with no dependence on the address.
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