发明名称 Method and device for optoelectronic quality control
摘要 In a method for the optoelectronic quality control of moving specimens (1) by comparison with an original (4) by means of a camera (3) in real time, the pixels (12.P; 12.O) which are to be scanned by the camera (3) are controlled by a control computer (7). An analog comparison is carried out of the signals taken by the camera (3) and signals which coincide because of identical pixels (12.P; 12.O) are erased. Only the non-erased, remaining signals - error signals - are digitised and further processed in an evaluation computer (20). <IMAGE>
申请公布号 DE3612256(A1) 申请公布日期 1987.10.22
申请号 DE19863612256 申请日期 1986.04.11
申请人 TWI TECHNISCH-WISSENSCHAFTLICHE INDUSTRIEBERATUNG GMBH 发明人 EBERHARD,HANS-JOACHIM,DIPL.-ING.;BRAUN,THOMAS,DIPL.-INFORM.;GUTZEIT,ANDREAS
分类号 G01N21/84;G01N21/88;G01N21/956;(IPC1-7):G01M11/00;G06K9/62;G06F15/66 主分类号 G01N21/84
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