| 摘要 |
PURPOSE:To enable to measure a magnetostriction constant with higher accuracy on the basis of micro magnetostriction, by providing a magnetic field applying means on an x-ray two-crystal diffraction device, and utilizing a steep slope part to measure a lattice constant. CONSTITUTION:With two-crystal x-rays, a sample 12 on a sample bedplate is irradiated, and diffracted x-rays are detected with a detector 16. When the detector 16 is shifted to a steep ramp part theta, of a curved line of diffracted x-ray intensity, diffracted x-ray intensity almost overlapping in the peak value is identified by means of micro magnetostriction and detected. Accordingly, a lattice constant changing in accordance with a magnetostriction constant is determined on the basis of a difference among diffracted x-rays detected in a case where a magnetic field is applied by means of magnetic field applying means 18-20 and in a case not applied in the two directions perpendicular and parallel to the surface of the sample 12, and the magnetostriction constant of a magnetic thin film and others is measured with higher accuracy. |
