| 摘要 |
PURPOSE:To reduce the time and cost required in the formation of a test pattern, by changing over a external input signal and the output signal of a combined circuit part to connect the same to the input terminal of a sequence circuit part and changing over the output signal of the sequence circuit part and the output signal of the combined circuit to output the same to the outside. CONSTITUTION:In a semiconductive integrated circuit containing a sequence circuit part 2 and a combined circuit part 1, two transfer gates constituted of FETQ1, Q2 and FETQ3, Q4 are provided to an input buffer gate 3 and an external input signal and the output signal of the circuit part 1 are changed over to be connected to the input terminal of the circuit part 2. FETQ5, Q6 and FETQ7, Q8 are provided to an output buffer gate 4 and the output signal of the circuit part 2 and that of the circuit part 1 are changed over to be outputted to the outside. By this method, without using an exclusive test terminal at the time of the testing of the sequence circuit, the sequence circuit part can be directly accessed from the outside. |
