发明名称 |
INTEGRATED CIRCUIT WITH STRESS ISOLATED HALL ELEMENT |
摘要 |
<p>INTEGRATED CIRCUIT WITH STRESS ISOLATED HALL ELEMENT A silicon integrated circuit includes a centrally located Hall element having an annular moat region surrounding the Hall element to isolate it from built-in stresses in adjacent parts of the IC. The moat comprises at least one annular isolation wall, but preferably two concentric isolation walls. This moat construction also leads to a reduction in dependency of Hall element symmetry upon process variables.</p> |
申请公布号 |
CA1220874(A) |
申请公布日期 |
1987.04.21 |
申请号 |
CA19850477500 |
申请日期 |
1985.03.26 |
申请人 |
SPRAGUE ELECTRIC COMPANY |
发明人 |
HIGGS, JACOB K.;HUMENICK, JOHN M. |
分类号 |
H01L43/06;H01L21/761;H01L27/22;(IPC1-7):H01L27/22;H01L21/76 |
主分类号 |
H01L43/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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