发明名称 INTEGRATED CIRCUIT WITH STRESS ISOLATED HALL ELEMENT
摘要 <p>INTEGRATED CIRCUIT WITH STRESS ISOLATED HALL ELEMENT A silicon integrated circuit includes a centrally located Hall element having an annular moat region surrounding the Hall element to isolate it from built-in stresses in adjacent parts of the IC. The moat comprises at least one annular isolation wall, but preferably two concentric isolation walls. This moat construction also leads to a reduction in dependency of Hall element symmetry upon process variables.</p>
申请公布号 CA1220874(A) 申请公布日期 1987.04.21
申请号 CA19850477500 申请日期 1985.03.26
申请人 SPRAGUE ELECTRIC COMPANY 发明人 HIGGS, JACOB K.;HUMENICK, JOHN M.
分类号 H01L43/06;H01L21/761;H01L27/22;(IPC1-7):H01L27/22;H01L21/76 主分类号 H01L43/06
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