发明名称 DIVISIONAL MEASUREMENT METHOD FOR CHIP DIVERGENCE AMOUNT OF LIGHT EMITTING ELEMENT
摘要 PURPOSE:To enable a quantitative detection of an amount of chip divergence between a light emitting center and a center of the surface of the package to accomodate a light emitting center by means of a photo-diode divided into four while light emitting from a light emitting element chip is being made. CONSTITUTION:An optical scope 5 is installed between a light emitting element chip 3 and a photo-diode divided into four 6 and the chip 4 is made light- emitting by turning on an electric current and the outputs of the fan-shaped photo-diode divided into four A-D are adjusted to be equal. When an optical image W deviates from the center R of the photo-diode divided into four 6, the outputs VA-VD of the photo-diodes A-D become unbalanced. A divergence can be detected from a degree of the above unbalance, therefore first DELTAX and DELTAY, ratios of the partial sums of adjacent two out of four outputs are calculated by the equations I and II and then, using DELTAX and DELTAY, an amount of divergence between a light emitting center Q of the chip 4 and a center 0 of a package 3 can be obtained.
申请公布号 JPS61228303(A) 申请公布日期 1986.10.11
申请号 JP19850070682 申请日期 1985.04.02
申请人 SUMITOMO ELECTRIC IND LTD 发明人 UEHARA KENICHIRO;ISOGA KAZUYOSHI
分类号 H01L21/68;G01B11/00;H01L21/67;H01L33/58;H01S5/00 主分类号 H01L21/68
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