发明名称 INSPECTION OF FOREIGN MATTER
摘要 PURPOSE:To prevent a circuit pattern from being misjudged to a foreign matter, by employing a flat spot-shaped scan laser beam. CONSTITUTION:A spot light A made flat in the direction of scanning (direction Y) employs that equal to the circular spot light B used in the conventional method in the axial length L, center peak intensity E and overall energy in the direction (X) perpendicular to the direction of scanning. With such an arrangement, the reflectionally scattered energy from the edge part C of a circuit pattern is proportional in the magnitude the length of the long segment PQ at the edge part C positioned inside in the case of the circular spot light B of the conventional method whereas it is proportional to the length of the short segment RS at the edge part C positioned inside in the case of the flat- shaped spot light A. Thus, the reflectionally scattered energy from the edge part C of the circuit pattern can be reduced to RS/PQ as compared with that in the past.
申请公布号 JPS61162738(A) 申请公布日期 1986.07.23
申请号 JP19850003835 申请日期 1985.01.11
申请人 HITACHI LTD;HORIBA LTD 发明人 HORIUCHI SHOICHI;MARUYAMA TAKASHI;KISHIMOTO TOSHIHIKO;UKON JUICHIRO
分类号 G01B11/30;G01N21/88;G01N21/94;G01N21/956;G03F1/84;H01L21/027;H01L21/66 主分类号 G01B11/30
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