发明名称 APPARATUS FOR TESTING INTEGRATED CIRCUIT
摘要 PURPOSE:To make it possible to perform the electrostatic discharge test of IC within a short time even by a person other than an expert, by automatically performing the application of surge voltage, the measurement of voltage and current characteristics and the quality judgement of IC by a series of operations by a control part. CONSTITUTION:A control part 12 turns only the predetermined switch of a terminal selection switch group 11 ON at first on the basis of input data. Next, both of a measuring selection switch 14 and the charge and discharge switch 16 of a surge voltage applying part 15 are set to the side of a contact (a) and a polarity switch 17 is set to adequate polarity. Subsequently, applied surge voltage value data is sent to a surge voltage setting part 18 through an interface 26 and converted to an analogue value by a D/A converter 18a and a high voltage constant voltage power source part 18b outputs applying surge voltage. The control part 12 sets the charge and discharge switch 16 to the side of a contact (b) as the next stage to apply surge voltage to the terminal of IC. Thereafter, voltage and current characteristics are investigated on the basis of the signal of the control part 12 to perform quality judgement.
申请公布号 JPS6195258(A) 申请公布日期 1986.05.14
申请号 JP19840217006 申请日期 1984.10.16
申请人 SANYO ELECTRIC CO LTD 发明人 IWASAKI KUSUYA
分类号 G01R31/28;G01R31/00;G01R31/26;G01R31/30 主分类号 G01R31/28
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