发明名称 QUANTITATIVE ANALYSIS OF SILICON
摘要 PURPOSE:To analyze quantitatively Si at high sensitivity and accuracy, by performing under-equivalent analysis by barium chloride as residue of barium silico-fluoride, at separation of Si-31 generated by nuclear reaction of Si-30, after distillation separation as silicon silico-fluoride and after marking it to iron silico-hydrogenfluoride by hydrofluoric acid. CONSTITUTION:An analyzing specimen and the standard specimen containing Si of known quantity are subjected to neturon radiation under the same condition and after adding Si-carriers respectively. A specimen solution is prepared. Next, Si containing Si-31 produced by the neutron radiation is separated from the analyzing specimen solution as silicon fluoride and after transforming it to silico-fluoride hydrogen ion by hydrofluoric acid, the under-equivalent residual separation is performed on the constant partial quantity of Si-31 as barium silico-fluoride by aqueous solution of barium chloride. By comparing radio-activity of Si-31 thus obtained with that of Si-31l subjected to the under-equivalent residual separation in the same way as the analyzing specimen solution from the Si-containing standard specimen, Si is analyzed in a quantitative manner.
申请公布号 JPS6166157(A) 申请公布日期 1986.04.04
申请号 JP19840188657 申请日期 1984.09.08
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 KANO KOJI;KOBAYASHI KENJI
分类号 G01N23/221;C01B33/00;G01N23/222;G01N31/00;G01N31/02 主分类号 G01N23/221
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