| 摘要 |
A method for the contactless testing of an object, particularly microcircuits, employs a particle beam probe to permit a resistance determination in a load-free fashion and without chronological variations of the charge state of the object. A first measuring spot is irradiated with a write beam of approximately a primary electron energy EPE=2Eo, whereby Eo is that particular energy at which the number of charges leaving the object is equal to the number of charges incident on the object. Then an additional measuring spot is checked as to whether it exhibits a conductive connection with the first measuring spot. The second measuring spot can be checked as to whether a specimen current is flowing. On the second measuring spot a read current of approximately a primary electron energy EPE=Eo can be directed. The number of secondary electrons detected with a detector then serves the purpose of determining whether a conductive connection exists between the first measuring spot and the secondary measuring spot.
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