发明名称 Method and apparatus for controlling sample temperature
摘要 This invention relates to a method and apparatus for controlling temperature of a sample and is intended to prevent a sample from being deformed by the pressure of a heat transmission gas by mounting and fixing the sample being mounted and processed in a vacuum on and to the sample stand and supplying the heat transmission gas to the gap between the under surface of the sample thus fixed and the sample stand; effectively control the temperature of the sample being processed in a vacuum by limiting the size of the gap between the under surface of the sample and the sample stand; and make the heat transmission gas least affect the process by limiting the flow of the heat transmission gas in the vacuum process chamber.
申请公布号 US4565601(A) 申请公布日期 1986.01.21
申请号 US19840675863 申请日期 1984.11.28
申请人 HITACHI, LTD. 发明人 KAKEHI, YUTAKA;NAKAZATO, NORIO;FUKUSHIMA, YOSHIMASA;HIRATSUKA, KOUSAI;SHIBATA, FUMIO;YAMAMOTO, NORIAKI;TSUBONE, TSUNEHIKO
分类号 B61D19/02;C23C14/54;G05D23/19;(IPC1-7):B44C1/22;C03C15/00;C03C25/06;C23F1/02 主分类号 B61D19/02
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