发明名称 SURFACE WAVE PROBE DEVICE
摘要 PURPOSE:To perform high-precision flaw detection while reducing the area of a water dipped type probe by employing a water column nozzle coupling system for the acoustic coupling of the water dipped type probe, fitting a partition film having a thin hole atop of a nozzle, and spouting water from the thin hole and wetting a contact surface. CONSTITUTION:The water column nozzle 13 made of plastic is provided to the lower part of the internal pipe of the water dipped type probe 11, the partition film 17 is fitted atop of it, and the thin hole 19 is bored. The probe 11 is provided with a feed water pipe 14 and water is flowed to the water column nozzle 13; and an external cylinder 15 is provided outside of the water column nozzle 13 to such the space 150 in the external cylinder 15. Then, the probe 11 is brought into contact with an objective body 20, the contact surface is wetted with water from the thin hole 19 of the partition film 17, and water staying on the contact surface is sucked through the external cylinder 15. Thus, ultrasonic flaw detection is performed on water column nozzle basis by using the partition film, so water wetting does not become excessive between the probe and objective body and the flaw detection is carried out easily with high precision while the contact surface of the probe is reduced in size even if the surface of objective body has undulations.
申请公布号 JPS60198452(A) 申请公布日期 1985.10.07
申请号 JP19840054481 申请日期 1984.03.23
申请人 TOKYO KEIKI KK 发明人 SEKIGUCHI KOUJI
分类号 G01N29/04;G01N29/24;G01N29/28 主分类号 G01N29/04
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