发明名称 TESTING SYSTEM OF SEMICONDUCTOR
摘要 PURPOSE:To reduce equipment and manhours by eliminating the need for replacing test sets in cases where verification by manual operation is required by a method wherein a switch with machanical contacts is incorporated into an adjusting jig and the IC input driver circuit of the testing system is provided with an auto/manual switching means. CONSTITUTION:A manual input driver circuit is composed of an auto/manual switching circuit 5 installed between a fixed memory 4 and an input driver circuit 6 of a testing system 1. An AND/OR circuit, for example, is used to constitute the auto/manual switching circuit 5, which supplies an IC8 with necessary information when an input switch 11 of an adjusting jig 3 is operated. The IC8 operates upon receiving input about a functional test and its output if forwarded to a comparator circuit 7 housed in the testing system 1. The test system 1 processes the signals yielded by the IC8 just like signals for a probing test and the result is displayed on a display circuit 13 for verification. This eliminates the need for an extra manual test jig or the work of connecting to the test system 1 a circuit exclusively for a manual test.
申请公布号 JPS60100445(A) 申请公布日期 1985.06.04
申请号 JP19830207559 申请日期 1983.11.07
申请人 OKI DENKI KOGYO KK 发明人 SASANO SATORU
分类号 G01R31/26;G01R31/28;H01L21/66 主分类号 G01R31/26
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