发明名称 AUTOMATIC TESTING APPARATUS FOR INDUSTRIAL INSTRUMENT
摘要 PURPOSE:To perform the test of industrial instruments automatically in a short time, by performing a specified operation based on the signals from the instruments under test, which are inputted to an input measuring part at every switching by a switch control means. CONSTITUTION:Testing signals from a CPU5 reach an output switching device 9 through an I/O interface (IF)4, a DA converter 7, and an output circuit 8. Then, output terminals O1-On of the switching device 9 are sequentially connected to a common terminal Oc, and series of the testing signals of 0, 25, 50-100% are sequentially inputted to instruments under test 13-1-13-n. Meanwhile, input terminals I1-In of an input switching device 1 are sequentially switched, in correspondence with the switching of the output switching device 9. The outputs from the instruments under test 13-1-13-n are sequentially inputted to the CPU5 through an input circuit 2, an AD converter 3, and the IF4. Pass or fail is judged by the CPU5. When the instrument passes the test signal of 100%, the test result is displayed on a display part 10 and a printing part 11. Therefore the test is automatically conducted in a short time.
申请公布号 JPS6050416(A) 申请公布日期 1985.03.20
申请号 JP19830158750 申请日期 1983.08.30
申请人 SHIMAZU SEISAKUSHO KK 发明人 YOSHIOKA TAKASHI;FUDEYASU TAKAHIRO
分类号 G01D21/00;(IPC1-7):G01D21/00 主分类号 G01D21/00
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