| 摘要 |
PURPOSE:To abbreviate the operation index in a high-temperature test by connecting plural semiconductor devices so that they are switched freely to a measurement power source in parallel and in series. CONSTITUTION:Pins 2 of plural semiconductor devices 1 are connected to contactors 8 projecting from a measuring device 7 and a connection between a contactor 8 and the measurement power source incorporated in the device 7 is selected by a relay matrix, etc., to switch the series and parallel connections of the device 1 with the measurement power source. Then, an open check in the series connection or sheet check in the parallel connection is made to test the plural semiconductor devices simultaneously at high temperature. Consequently, the operation index during the high temperature test of the semiconductor devices is abbreviated as compared with a one-by-one test of the operation index.
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