发明名称 IMAGE PROCESSING DEVICE OF FLAW PATTERN IN MAGNETIC PARTICLE INSPECTION
摘要 PURPOSE:To enable detection without errors in a flawed part by forming a synthesized image in which a background is erased from the continuously photographed flaw pattern by magnetic particles. CONSTITUTION:When the negatives P1, P2- on which the flaw patterns of magnetic particles are continuously photographed are superposed, the parts of a flaw 4 overlap and the magnetic particles move in the other parts and therefore the other parts do not overlap. If the negatives P1, P2- are photographed in the overlapped state, only the part of the flaw 4 appears and the synthetic image in which the part of the background is erased is formed on a negative Ps. As a result, the flaw part is detected without any error.
申请公布号 JPS59151055(A) 申请公布日期 1984.08.29
申请号 JP19830025303 申请日期 1983.02.17
申请人 NIHON DENJI SOTSUKI KK 发明人 MITSUYOSHI TERUMASA
分类号 G01B11/00;G01N21/91;G01N27/84 主分类号 G01B11/00
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