| 摘要 |
PURPOSE:To facilitate the test of an integrated circuit becoming complicated by providing an element array exclusive for the test at a part on the substrate of an integrated circuit which realizes desired functions by changing a wiring system by a function block system on the base substrate whereon element arrangement is common. CONSTITUTION:The integrated circuit 10 realizes the desired functions by the function block system. The inside of a chip is divided into three main functions of blocks 20-40, and the block 50 is provided with a testing scanning bath shift register, which block 50 is then arranged in the exclusive base region. Thereby, the output states of the blocks 20 and 30 can be detected as shift registers to the outside, and the input can be compulsively set to the block 40. Therefore, this integrated circuit unnecessitates many initial setting patterns as compared with a conventional example, testing patterns are reduced, and a testing method becomes easy. |
