发明名称 Device for analysing particles with optical reflector and impedance detection aperture
摘要 The invention consists of a particle analysis device. According to the invention, it comprises a reflecting chamber 24 containing an electrolyte having a concave reflecting surface 14 with a first focus 16 and a second focus 18, a drive structure 36 having a tube 38 for directing a flow of particles in suspension in an electrolyte solution, a radiant energy source 26 illuminating the particles when they pass through the first focus to produce a source of detectable radiation signals reflected by the concave surface, an outlet tube 41 in coaxial alignment with the tube 38, a detection aperture 42 at the end of the tube 38 or of the tube 41, and two energised (excited) electrodes in the electrolyte solution on either side of the aperture, which thus creates a restricted electrical path where the flow of particles produces electrical impedance signals. The invention applies especially to electronic and optical measurement particle analysers. <IMAGE>
申请公布号 FR2530023(A1) 申请公布日期 1984.01.13
申请号 FR19820012005 申请日期 1982.07.08
申请人 COULTER ELECTRONICS INC 发明人 ALBERT BRUNSTING, WALTER R. HOGG ET WILLIAM A. NEWTON;HOGG WALTER R;NEWTON WILLIAM A
分类号 G01N15/14;G01N21/47;(IPC1-7):G01N15/00;G01N21/85;G01N27/02 主分类号 G01N15/14
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