Measuring system for use in the radiation measurement of layer thicknesses and the like

摘要

A system for the radiation backscatter measurement of coating thicknesses has a stand for supporting a workpiece, and a probe body removably mounted on the stand and carrying a radiation source, a radiation detector and a sighting device, the probe body being vertically adjustable on the stand to selectively vary the height of the workpiece-receiving throat. The probe body is self-supporting independently of the stand on a workpiece or other supporting surface and can be inverted to provide its own workpiece support, being self-supporting when inverted. The source and detector are movable simultaneously as a unit with the sighting device to position first one and then the other in operative alinement with the axis of measurement.