发明名称 |
Method for the formation of polycrystalline silicon layers, and its application in the manufacture of a self-aligned, non planar, MOS transistor |
摘要 |
A method for forming a self-aligned MOS power transistor. A layer of silicon nitride is deposited uniformly over a plate with limited oxide zones. The plate is then placed in an acid bath and subjected to a potential difference. Only the zones of the polycrystalline silicon layer which are over the silica zones remain.
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申请公布号 |
US4420379(A) |
申请公布日期 |
1983.12.13 |
申请号 |
US19800187960 |
申请日期 |
1980.09.16 |
申请人 |
THOMSON-CSF |
发明人 |
TONNEL, EUGENE |
分类号 |
H01L21/28;H01L21/3213;H01L21/336;H01L29/10;H01L29/78;(IPC1-7):C25D11/32 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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