发明名称 Method for the formation of polycrystalline silicon layers, and its application in the manufacture of a self-aligned, non planar, MOS transistor
摘要 A method for forming a self-aligned MOS power transistor. A layer of silicon nitride is deposited uniformly over a plate with limited oxide zones. The plate is then placed in an acid bath and subjected to a potential difference. Only the zones of the polycrystalline silicon layer which are over the silica zones remain.
申请公布号 US4420379(A) 申请公布日期 1983.12.13
申请号 US19800187960 申请日期 1980.09.16
申请人 THOMSON-CSF 发明人 TONNEL, EUGENE
分类号 H01L21/28;H01L21/3213;H01L21/336;H01L29/10;H01L29/78;(IPC1-7):C25D11/32 主分类号 H01L21/28
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