发明名称 |
SURFACE TREATMENT METHOD FOR SEMICONDUCTOR |
摘要 |
PURPOSE:To obtain a surface of less impurities by heating the surface of a poly Si in a vacuum at a specific temperature for a fixed time. CONSTITUTION:A sample wherein the poly Si 3 is deposited on a Si substrate 1 via a thermal oxide film 2 is heated in a vacuum at 750-950 deg.C for 10min after washing with fluoric acid. Then, the amounts of oxygen and carbon of the surface of the poly Si remarkably decrease. In the meanwhile, the crystal grain diameter of the surface of the poly Si after heating does not vary. |
申请公布号 |
JPS58202536(A) |
申请公布日期 |
1983.11.25 |
申请号 |
JP19820084759 |
申请日期 |
1982.05.21 |
申请人 |
HITACHI SEISAKUSHO KK |
发明人 |
KOBAYASHI NOBUYOSHI;IWATA SEIICHI |
分类号 |
H01L21/302;H01L21/3065;H01L21/324 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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