| 摘要 |
<p>A high speed analog sampler using a CRT (21) having a number of target elements (43, 45) arranged in a circle with the electron beam being repetitively scanned over the target elements in a circle. The amplitude of the analog signal to be sampled is applied to a grid (41) of the CRT to modulate the intensity of the electron beam prior to its striking the conductors. Electrons striking the target elements create a detectable voltage proportional to the amplitude of the analog voltage at the various intervals in time that the electron beam struck the various target elements. This output can further be digitized by one or more analog-to-digital converters.</p> |
