发明名称 IMPROVEMENT IN AND RELATING TO THE MANUFACTURE OF WAFER SCALE INTEGRATED CIRCUITS
摘要 <p>The metallisation pattern for a wafer scale integrated circuit is achieved by the etching of a single metal layer (14) whereover photresist (16) has been exposed and developed using a step-and-repeat mask (18) for component bearing areas on the circuit (24) and a whole wafer reticle mask (26) for the areas of interconnection (30) between the component bearing areas (24).</p>
申请公布号 WO1983002362(A1) 申请公布日期 1983.07.07
申请号 GB1981000280 申请日期 1981.12.21
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